SPIE Proceedings [SPIE MOEMS-MEMS 2008 Micro and Nanofabrication - San Jose, CA (Saturday 19 January 2008)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII - Reliability testing and analysis of safing and arming devices for army fuzes
Zunino III, James L., Skelton, Donald R., Robinson, Charles, Hartzell, Allyson L., Ramesham, RajeshuniVolume:
6884
Year:
2008
Language:
english
DOI:
10.1117/12.765221
File:
PDF, 697 KB
english, 2008