Single Defect Studies by Means of Random Telegraph Signals...

Single Defect Studies by Means of Random Telegraph Signals in Submicron Silicon MOSFETs

Simoen, Eddy, Claeys, C., Lukyanchikova, N.B., Petrichuk, M.V., Garbar, N.P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
69-70
Year:
1999
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.69-70.467
File:
PDF, 408 KB
1999
Conversion to is in progress
Conversion to is failed