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Single Defect Studies by Means of Random Telegraph Signals in Submicron Silicon MOSFETs
Simoen, Eddy, Claeys, C., Lukyanchikova, N.B., Petrichuk, M.V., Garbar, N.P.Volume:
69-70
Year:
1999
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.69-70.467
File:
PDF, 408 KB
1999