Detailed Investigation of GaN Metal-Insulator-Semiconductor...

MRS Proceedings 2008 / 1 Vol. 1108

Detailed Investigation of GaN Metal-Insulator-Semiconductor Structures by Capacitance-voltage and Deep Level Transient Spectroscopy Methods

Kikawa, Junjiroh, Horiuchi, Yuki, Shibata, Eiji, Kaneko, Masamitsu, Otake, Hirotaka, Fujishima, Tatsuya, Chikamatsu, Kentaro, Yamaguchi, Atsushi, Nanishi, Yasushi
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Volume:
1108
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1108-A09-24
Date:
January, 2008
File:
PDF, 244 KB
english, 2008
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