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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Polarization Analysis and Measurement II - Fresnel's interface reflection coefficients for the parallel and perpendicular polarizations: global properties and facts not found in your textbook
Azzam, Rasheed M. A., Goldstein, Dennis H., Chenault, David B.Volume:
2265
Year:
1994
Language:
english
DOI:
10.1117/12.186660
File:
PDF, 890 KB
english, 1994