SPIE Proceedings [SPIE O-E/LASE'86 Symp (January 1986, Los...

  • Main
  • SPIE Proceedings [SPIE O-E/LASE'86 Symp...

SPIE Proceedings [SPIE O-E/LASE'86 Symp (January 1986, Los Angeles) - Los Angeles, CA (Tuesday 21 January 1986)] Advanced Processing and Characterization of Semiconductors III - Study Of The Effects Of Strain In Indium-Doped Gallium Arsenide By Electroreflectance And Photocapacitance

Raccah, Paul M., Garland, J. W., Zhang, Z., Mioc, S., De, Yang, Chu, Amy H. M., McGuigan, S,, Thomas, R. N., Sadana, Devindra K., Current, Michael I.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
623
Year:
1986
Language:
english
DOI:
10.1117/12.961192
File:
PDF, 184 KB
english, 1986
Conversion to is in progress
Conversion to is failed