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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III - Auto-scanning white-light interferometer

Chen, Jin-Liang, Tung, Chi-Hong, Kao, Ching-Fen, Chang, Calvin C., Duparré, Angela, Singh, Bhanwar, Gu, Zu-Han
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Volume:
6672
Year:
2007
Language:
english
DOI:
10.1117/12.733625
File:
PDF, 782 KB
english, 2007
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