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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Design of an interferometer for the measurement of long radius optics
Han, Sen, Lamb, Joseph A., Olszak, Artur G., Novak, Erik, Tobin, Jr., Kenneth W.Volume:
3966
Year:
2000
Language:
english
DOI:
10.1117/12.380092
File:
PDF, 891 KB
english, 2000