A Long-Term Reliability of Thermal Oxides Grown on n-Type...

A Long-Term Reliability of Thermal Oxides Grown on n-Type 4H-SiC Wafer

Senzaki, Junji, Goto, M., Kojima, Kazutoshi, Yamabe, Kikuo, Fukuda, Kenji
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.457-460.1269
File:
PDF, 356 KB
english, 2004
Conversion to is in progress
Conversion to is failed