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SPIE Proceedings [SPIE SPIE Scanning Microscopies - Monterey, California, United States (Tuesday 16 September 2014)] Scanning Microscopies 2014 - Rigorous quantitative elemental microanalysis by scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) with spectrum processing by NIST DTSA-II
Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K., Newbury, Dale E., Ritchie, Nicholas W. M.Volume:
9236
Year:
2014
Language:
english
DOI:
10.1117/12.2065842
File:
PDF, 4.12 MB
english, 2014