Variability in nanometer CMOS: Impact, analysis, and...

Integration, the VLSI Journal 2008 Vol. 41; Iss. 3

Variability in nanometer CMOS: Impact, analysis, and minimization

Dennis Sylvester, Kanak Agarwal, Saumil Shah
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Volume:
41
Year:
2008
Language:
english
Pages:
21
DOI:
10.1016/j.vlsi.2007.09.001
File:
PDF, 1.62 MB
english, 2008
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