Reliability characterization of silicon-based germanium waveguide photodetectors
Tu, Zhijuan, Zhou, Zhiping, Wang, XingjunVolume:
53
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/1.OE.53.5.057103
Date:
May, 2014
File:
PDF, 1.47 MB
english, 2014