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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics - Radiation hardness of silicon detectors manufactured on oxygen- and carbon-enriched material
Ruzin, Arie, Glaser, Maurice, Lemeilleur, Francois, James, Ralph B., Schirato, Richard C.Volume:
3768
Year:
1999
Language:
english
DOI:
10.1117/12.366608
File:
PDF, 356 KB
english, 1999