SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III - Ionization-excitation of He following electron and proton impact: a polarization study using an EUV polarimeter
Merabet, Hocine, Siems, Annette, Bruch, Reinhard F., Fuelling, Stephan, Bailey, Matthew, Fineschi, Silvano, Woodgate, Bruce E., Kimble, Randy A.Volume:
3764
Year:
1999
Language:
english
DOI:
10.1117/12.371076
File:
PDF, 611 KB
english, 1999