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SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, USA (Saturday 2 February 2013)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XX - Tomographic incoherent phase imaging, a diffraction tomography alternative for any white-light microscope
Bon, Pierre, Cogswell, Carol J., Brown, Thomas G., Aknoun, Shérazade, Savatier, Julien, Conchello, Jose-Angel, Wilson, Tony, Wattellier, Benoit, Monneret, SergeVolume:
8589
Year:
2013
Language:
english
DOI:
10.1117/12.2003426
File:
PDF, 965 KB
english, 2013