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Determination of the Residual Stress Field around Scratches Using Synchrotron X-Rays and Nanoindentation
Khan, M.K., Fitzpatrick, Michael E., Edwards, L.E., Hainsworth, S.V.Volume:
652
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.652.25
Date:
May, 2010
File:
PDF, 601 KB
english, 2010