Total internal reflection–based module for fluorescence and...

Journal of Micro/Nanolithography MEMS and MOEMS 2014 / 07 Vol. 13; Iss. 3

Total internal reflection–based module for fluorescence and absorbance detection

Verschooten, Tom, Ottevaere, Heidi, Vervaeke, Michael, Van Erps, Jürgen, Thienpont, Hugo
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Volume:
13
Language:
english
Journal:
Journal of Micro/Nanolithography, MEMS, and MOEMS
DOI:
10.1117/1.jmm.13.3.033001
Date:
July, 2014
File:
PDF, 1.81 MB
english, 2014
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