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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Time and Frequency Metrology II - Preparation of reduced-quantum-uncertainty input states for an atomic clock

Schleier-Smith, M. H., Leroux, I. D., Vuletić, V., Ido, Tetsuya, Reid, Derryck T.
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Volume:
7431
Year:
2009
Language:
english
DOI:
10.1117/12.828171
File:
PDF, 830 KB
english, 2009
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