SPIE Proceedings [SPIE SPIE Micro+Nano Materials, Devices, and Applications - Melbourne, Victoria, Australia (Sunday 8 December 2013)] Micro/Nano Materials, Devices, and Systems - Measuring the electrical properties of semiconductor nanowires using terahertz conductivity spectroscopy
Friend, James, Tan, H. Hoe, Joyce, Hannah J., Docherty, Callum J., Yong, Chaw-Keong, Wong-Leung, Jennifer, Gao, Qiang, Paiman, Suriati, Tan, H. Hoe, Jagadish, C., Lloyd-Hughes, James, Herz, Laura M.,Volume:
8923
Year:
2013
Language:
english
DOI:
10.1117/12.2049016
File:
PDF, 337 KB
english, 2013