SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] X-Ray Optics Design, Performance, and Applications - Comparative characterization of highly oriented pyrolytic graphite by means of diffraction topography
Tuffanelli, Alessandra, Sanchez del Rio, Manuel, Pareschi, Giovanni, Gambaccini, Mauro, Taibi, Angelo, Fantini, Alessia, Ohler, M., Khounsary, Ali M., Freund, Andreas K., Ishikawa, Tetsuya, Srajer, GeVolume:
3773
Year:
1999
Language:
english
DOI:
10.1117/12.370091
File:
PDF, 602 KB
english, 1999