SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies - Constanta, Romania (Thursday 26 August 2010)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V - Lateral shearing interferometry with a deformable mirror for wavefront analysis
Garoi, F., Apostol, D., Schiopu, P., Schiopu, Paul, Caruntu, GeorgeVolume:
7821
Year:
2010
Language:
english
DOI:
10.1117/12.881723
File:
PDF, 802 KB
english, 2010