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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronics - San Jose, CA (Thursday 20 January 2000)] Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V - Scaling diode-pumped Nd3+and Yb3+-doped YCa4O(BO3)3 (YCOB) self-frequency doubling lasers
Hammons, Dennis A., Richardson, Martin C., Chai, Bruce H. T., Chin, Aland K., Jollay, Richard A., Burnham, Geoffrey T., He, Xiaoguang, Linden, Kurt J., Wang, S. C.Volume:
3945
Year:
2000
Language:
english
DOI:
10.1117/12.380555
File:
PDF, 685 KB
english, 2000