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Vibrational Lifetimes of Hydrogen and Silicon MOSFET Reliability
Feldman, Leonard C., Lüpke, G., Tolk, N.H.Volume:
95-96
Year:
2004
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.95-96.123
File:
PDF, 220 KB
english, 2004