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An Extended EDMR Setup for SiC Defect Characterization
Gruber, Gernot, Koch, Markus, Pobegen, Gregor, Nelhiebel, Michael, Hadley, PeterVolume:
740-742
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.740-742.365
Date:
January, 2013
File:
PDF, 561 KB
english, 2013