Modeling time-dependent dielectric breakdown with and...

Modeling time-dependent dielectric breakdown with and without barriers

Plawsky, Joel L.
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Volume:
9
Language:
english
Journal:
Journal of Micro/Nanolithography, MEMS, and MOEMS
DOI:
10.1117/1.3492412
Date:
November, 2010
File:
PDF, 546 KB
english, 2010
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