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Impact of polarization on an attenuated phase shift mask with ArF hyper-numerical aperture lithography
Sato, TakashiVolume:
5
Language:
english
Journal:
Journal of Micro/Nanolithography, MEMS, and MOEMS
DOI:
10.1117/1.2397065
Date:
October, 2006
File:
PDF, 1014 KB
english, 2006