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SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - The surface roughness investigation by the atomic force microscopy, x-ray scattering, and light scattering
Zanaveskin, M. L., Grishchenko, Yu. V., Tolstikhina, A. L., Asadchikov, V. E., Roshchin, B. S., Azarova, V. V., Valiev, Kamil A., Orlikovsky, Alexander A.Year:
2012
Language:
english
DOI:
10.1117/12.683482
File:
PDF, 590 KB
english, 2012