![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Analysis of laser-induced damage threshold in dielectric optical film
Shang, Xuchuan, Ma, Ping, Hu, Jianping, Zhang, Rongzhu, Yang, Li, Chen, Yaolong, Kley, Ernst-Bernhard, Li, RongbinVolume:
6722
Year:
2007
Language:
english
DOI:
10.1117/12.783358
File:
PDF, 738 KB
english, 2007