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SPIE Proceedings [SPIE 1983 Cambridge Symposium - Cambridge (Monday 7 November 1983)] Spectroscopic Characterization Techniques for Semiconductor Technology I - Determination Of Indirect Conduction Band Minima In Semiconductors By Core-Level Reflectance Spectroscopy
Kelso, S. M., Aspnes, D. E., Olson, C. G., Lynch, D. W., Bachmann, K. J., Bauer, Robert S., Pollak, Fred H.Volume:
452
Year:
1984
Language:
english
DOI:
10.1117/12.939294
File:
PDF, 1.02 MB
english, 1984