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SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology XII - Yokohama, Japan (Wednesday 13 April 2005)] Photomask and Next-Generation Lithography Mask Technology XII - Lithography process related OPC development and verification demonstration on a sub-90nm poly layer

Hung, Chi-Yuan, Liu, Qingwei, Zhang, Liguo, Shang, Shumay, Jost, Andrew, Komuro, Masanori
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Volume:
5853
Year:
2005
Language:
english
DOI:
10.1117/12.617194
File:
PDF, 530 KB
english, 2005
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