Performance of a 650V SiC Diode with Reduced Chip Thickness
Rupp, Roland, Gerlach, Rolf, Kirchner, Uwe, Schlögl, Andreas, Kern, RonnyVolume:
717-720
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.717-720.921
Date:
May, 2012
File:
PDF, 405 KB
english, 2012