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SPIE Proceedings [SPIE SPIE MOEMS-MEMS - San Francisco, California, United States (Saturday 1 February 2014)] Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII - Characterization of gallium nitride microsystems within radiation and high-temperature environments
Shea, Herbert R., Ramesham, Rajeshuni, Chiamori, Heather C., Hou, Minmin, Chapin, Caitlin A., Shankar, Ashwin, Senesky, Debbie G.Volume:
8975
Year:
2014
Language:
english
DOI:
10.1117/12.2046690
File:
PDF, 801 KB
english, 2014