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SPIE Proceedings [SPIE SPIE Third International Symposium on Fluctuations and Noise - Austin, TX (Monday 23 May 2005)] Noise in Devices and Circuits III - A physical understanding of the noise performance of MOS transistors for wireless and lightwave applications in the giga-bit regime (Invited Paper)
Jindal, R. P., Balandin, Alexander A., Danneville, Francois, Deen, M. Jamal, Fleetwood, Daniel M.Volume:
5844
Year:
2005
Language:
english
DOI:
10.1117/12.609965
File:
PDF, 247 KB
english, 2005