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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 10 August 2008)] Interferometry XIV: Applications - Transparent film profiling and analysis by interference microscopy
de Groot, Peter J., Colonna de Lega, Xavier, Novak, Erik L., Osten, Wolfgang, Gorecki, ChristopheVolume:
7064
Year:
2008
Language:
english
DOI:
10.1117/12.794936
File:
PDF, 331 KB
english, 2008