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Reliability of Low-Temperature Poly-Si Thin-Film Transistors
Inoue, Y., Ogawa, H., Endo, Takeshi, Yano, Hiroshi, Hatayama, Tomoaki, Uraoka, Yukiharu, Fuyuki, TakashiVolume:
93
Year:
2003
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.93.43
File:
PDF, 321 KB
2003