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SPIE Proceedings [SPIE SPIE Remote Sensing - Amsterdam, Netherlands (Monday 22 September 2014)] Image and Signal Processing for Remote Sensing XX - Full scale assessment of pansharpening methods and data products
Bruzzone, Lorenzo, Benediktsson, Jon Atli, Bovolo, Francesca, Aiazzi, B., Alparone, L., Baronti, S., Carlà, R., Garzelli, A., Santurri, L.Volume:
9244
Year:
2014
Language:
english
DOI:
10.1117/12.2067770
File:
PDF, 1.25 MB
english, 2014