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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Image Processing: Algorithms and Systems XIII - A method for predicting DCT-based denoising efficiency for grayscale images corrupted by AWGN and additive spatially correlated noise
Egiazarian, Karen O., Agaian, Sos S., Gotchev, Atanas P., Rubel, Aleksey S., Lukin, Vladimir V., Egiazarian, Karen O.Volume:
9399
Year:
2015
Language:
english
DOI:
10.1117/12.2082533
File:
PDF, 1.51 MB
english, 2015