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Correlation between the Ageing and the Grain Size of Polysilicon Thin-Film Transistors
Toutah, H., Tala-Ighil, B., Llibre, J.F., Mohammed-Brahim, T., Helen, Youri, Gautier, G., Mourgues, K., Raoult, F.Volume:
80-81
Year:
2001
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.80-81.343
File:
PDF, 467 KB
2001