![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Optimal design of optical length in low turbidity measurement system with wavelength 1310 nm and 1550 nm
Han, Sen, Yoshizawa, Toru, Zhang, Song, Cao, Hui-bin, Liu, Jian-guo, Gui, Hua-qiao, Wang, Jie, Wang, Huan-qinVolume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2071612
File:
PDF, 953 KB
english, 2014