SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] X-Ray Nanoimaging: Instruments and Methods - The Maia detector array and x-ray fluorescence imaging system: locating rare precious metal phases in complex samples
Lai, Barry, Ryan, C. G., Siddons, D. P., Kirkham, R., Li, Z. Y., de Jonge, M. D., Paterson, D., Cleverley, J. S., Kuczewski, A., Dunn, P. A., Jensen, M., De Geronimo, G., Howard, D. L., Godel, B., DylVolume:
8851
Year:
2013
Language:
english
DOI:
10.1117/12.2027195
File:
PDF, 1.44 MB
english, 2013
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