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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Interferometry XVII: Techniques and Analysis - Improvement of defect detection in shearography by using principal component analysis
Creath, Katherine, Burke, Jan, Schmit, Joanna, Vandenrijt, Jean-François, Lièvre, Nicolas, Georges, Marc P.Volume:
9203
Year:
2014
Language:
english
DOI:
10.1117/12.2062831
File:
PDF, 482 KB
english, 2014