Intergate Dielectric Engineering Toward Large P/E Window...

Intergate Dielectric Engineering Toward Large P/E Window Planar NAND Flash

Breuil, Laurent, Lisoni, Judit G., Blomme, Pieter, Tan, Chi Lim, Van den Bosch, Geert, Van Houdt, Jan
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2413053
Date:
May, 2015
File:
PDF, 2.76 MB
english, 2015
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