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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Thirteenth International Conference on Solid State Lighting - An imaging-based photometric and colorimetric measurement method for characterizing OLED panels for lighting applications
Kane, Matthew H., Jiao, Jianzhong, Dietz, Nikolaus, Huang, Jian-Jang, Zhu, Yiting, Narendran, Nadarajah, Tan, Jianchuan, Mou, XiVolume:
9190
Year:
2014
Language:
english
DOI:
10.1117/12.2062262
File:
PDF, 615 KB
english, 2014