Quantitative interferometric microscopy with improved...

Optical Engineering 2014 / 11 Vol. 53; Iss. 11

Quantitative interferometric microscopy with improved full-field phase aberration compensation

Xue, Liang, Wang, Shouyu, Yan, Keding, Sun, Nan, Li, Zhenhua, Liu, Fei
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
53
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/1.OE.53.11.113105
Date:
November, 2014
File:
PDF, 4.35 MB
english, 2014
Conversion to is in progress
Conversion to is failed