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SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Silicon Carbide Materials for Optics and Precision Structures - Thermal strain characteristics of RBO silicon carbide to 4 K and resultant hysteresis
Pepi, John W., Altshuler, Thomas L., Ealey, Mark A.Volume:
2543
Year:
1995
Language:
english
DOI:
10.1117/12.225290
File:
PDF, 475 KB
english, 1995