![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2008 - San Jose, CA (Saturday 19 January 2008)] Gallium Nitride Materials and Devices III - Status of GaN HEMT performance and reliability
Green, Daniel S., Brown, J. D., Vetury, R., Lee, S., Gibb, S. R., Krishnamurthy, K., Poulton, M. J., Martin, J., Shealy, J. B., Morkoç, Hadis, Litton, Cole W., Chyi, Jen-Inn, Nanishi, Yasushi, Yoon, EVolume:
6894
Year:
2008
Language:
english
DOI:
10.1117/12.763781
File:
PDF, 365 KB
english, 2008