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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, California (Sunday 17 January 2010)] Computer Vision and Image Analysis of Art - Documentation instead of visualization - applications of 3D scanning in works of art analysis
Bunsch, Eryk, Sitnik, Robert, Stork, David G., Coddington, Jim, Bentkowska-Kafel, AnnaVolume:
7531
Year:
2010
Language:
english
DOI:
10.1117/12.839193
File:
PDF, 11.18 MB
english, 2010