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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Ultrafast Nonlinear Imaging and Spectroscopy II - Ultrafast valley relaxation dynamics in single layer semiconductors
Liu, Zhiwen, Barrette, Andrew, Mai, Cong, Yu, Yifei, Semenov, Yuriy, Jin, Zhenghe, Kim, Ki Wook, Cao, Linyou, Gundogdu, KenanVolume:
9198
Year:
2014
Language:
english
DOI:
10.1117/12.2062401
File:
PDF, 589 KB
english, 2014