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Characteristics of a Schottky Barrier Diode and the SiC Wafers Sliced by Wire Electrical Discharge Machining
Miyake, Hidetaka, Tomita, Nobuyuki, Nakaki, Yoshiyuki, Furusho, Tomoaki, Itokazu, Atsushi, Hashimoto, Takashi, Toyoda, Yoshihiko, Yamakawa, Satoshi, Sumitani, Hiroaki, Kuroiwa, Takeharu, Sato, TatsushVolume:
778-780
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.778-780.784
Date:
February, 2014
File:
PDF, 2.06 MB
english, 2014