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SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ (Sunday 22 March 1992)] Spectroscopic Characterization Techniques for Semiconductor Technology IV - Dielectric functions and critical point transitions of single strained and relaxed InxGa1-xAs/GaAs epilayers studied by spectroscopic ellipsometry and photoreflectance
Carline, Roger T., Pickering, Christopher, Garawal, N. S., Lancefield, David, Howard, Leslie K., Emeny, M. T., Glembocki, Orest J.Volume:
1678
Year:
1992
Language:
english
DOI:
10.1117/12.60463
File:
PDF, 313 KB
english, 1992