SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Diagnostics of optical nonlinearities: spatial beam distortion technique and its application to semiconductors and novel materials
Borshch, Anatoly A., Brodyn, Mikhail S., Gayvoronsky, Vladimir Y., Svechnikov, Sergey V., Valakh, Mikhail Y.Year:
2012
Language:
english
DOI:
10.1117/12.497191
File:
PDF, 355 KB
english, 2012